Applied charged particle optics
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrosta...
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Springer
2017
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oai:112.137.131.14:VNU_123-247772020-06-15T09:17:35Z Applied charged particle optics Liebl, Helmut Physics Atomic & Molecular Particle beams Vật lý nguyên tử Vật lý Dầm hạt 539.72112 Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added. 588 0 |aPrint version record. 2017-04-05T08:51:16Z 2017-04-05T08:51:16Z 2008 Book 9783540719243 http://repository.vnu.edu.vn/handle/VNU_123/24777 en 136 p. application/pdf Springer |
institution |
Đại học Quốc Gia Hà Nội |
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language |
English |
topic |
Physics Atomic & Molecular Particle beams Vật lý nguyên tử Vật lý Dầm hạt 539.72112 |
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Physics Atomic & Molecular Particle beams Vật lý nguyên tử Vật lý Dầm hạt 539.72112 Liebl, Helmut Applied charged particle optics |
description |
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
588 0 |aPrint version record. |
format |
Book |
author |
Liebl, Helmut |
author_facet |
Liebl, Helmut |
author_sort |
Liebl, Helmut |
title |
Applied charged particle optics |
title_short |
Applied charged particle optics |
title_full |
Applied charged particle optics |
title_fullStr |
Applied charged particle optics |
title_full_unstemmed |
Applied charged particle optics |
title_sort |
applied charged particle optics |
publisher |
Springer |
publishDate |
2017 |
url |
http://repository.vnu.edu.vn/handle/VNU_123/24777 |
work_keys_str_mv |
AT lieblhelmut appliedchargedparticleoptics |
_version_ |
1787735906462990336 |